In this detailed session, we delve deeper into the Atomic Force Microscope (AFM), exploring its advanced functionalities and applications. We discuss the operational principles that highlight its precision in nanoscale imaging. The module covers calibration techniques and the importance of tip selection for different types of surface characterization. Students will also learn about various scanning modes and how to interpret AFM data effectively. This lecture is essential for understanding the role of AFM in thin film patterning and surface science.